Construction of patent risk assessment indicator system and an international comparison of key indicators
CHENG Yanlin1, LIU Zhipeng2, DAI Tao1
1. Institute of Science and Development, Chinese Academy of Sciences, Beijing 100190, China;
2. School of Public Policy and Management, University of Chinese Academy of Sciences, Beijing 100049, China
Abstract：Based on the perspective of economic security and the theory of the patent value chain, an assessment system for a set of patent risk indicators is constructed in this paper, to measure the degree of risk encountered by a country or region in patent activities. 4 key indicators of patent basic activities are identified, namely, the patent quality level, the patent transformation ability, the patent dispute risk index, and the patent trade level, and a comparative analysis is carried out among the United States, Japan, South Korea, Germany and China. In conclusion, China's patent development during the years from 2006 to 2015 is "fast but not in a high level", "big but not powerful". Compared with other patent powerful countries, China is not dominant and even in serious risks in the patent value chain of the key nodes in the competition, especially the increasing patent royalty deficit, which poses a certain degree of danger.
程燕林, 刘志鹏, 代涛. 专利风险评价指标体系构建及关键指标国际比较[J]. 科技导报, 2019, 37(14): 26-33.
CHENG Yanlin, LIU Zhipeng, DAI Tao. Construction of patent risk assessment indicator system and an international comparison of key indicators. Science & Technology Review, 2019, 37(14): 26-33.
2019, Vol. 37 
