Si-PIN Detector Response Function Model and Its Applications in EDXRF Technology
LI Zhe1,3, TUO Xianguo2, SHI Rui1
1. Provincial Key Laboratory of Applied Nuclear Technology in Geosciences, Chengdu University of Technology, Chengdu 610059, China;2. Key Discipline Laboratory of National Defense for Radioactive Waste and Environmental Security, Southwest University of Science and Technology, Mianyang 621010, Sichuan Province, China;3. Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
Abstract：The spectrum analysis can be carried out via establishing the detector response function(DRF), to improve the automation level and the computation accuracy of the spectrum data processing. A general DRF model is established for Si-PIN detectors via the analysis of the X-ray physical detect procedure. The model contains four parts: a flat continuum shift from zero to full energy; a Gaussian shaped principal component of full energy peak; a Gaussian shaped Si escape peak; and an exponential tail on the low energy side of the full energy peak. Each part of the model, with a simple format, has a clear and definite physical meaning. Parameters are obtained by using the program, based on the Weighted Least-Squares(WLS) method. Nineteen elements' X-ray spectra in total are fitted in the study, and the fitting reduced chi-squares are also obtained simultaneously, which is in the range of 1.05-2.71. It is shown that this DRF model can represent the characteristic X-ray spectrum peak shape very well.
李哲;庹先国;石睿. Si-PIN探测器响应函数模型及其在EDXRF技术中的应用[J]. , 2013, 31(28-29): 35-38.
LI Zhe;TUO Xianguo;SHI Rui. Si-PIN Detector Response Function Model and Its Applications in EDXRF Technology. , 2013, 31(28-29): 35-38.