Impact of Transient Current and Ground Potential Rising on PC in Lightning Risk Assessment

YANG Zhongjiang;YU Shuyu;CHENG Bin

Science & Technology Review ›› 2011, Vol. 29 ›› Issue (26) : 57-60.

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Science & Technology Review ›› 2011, Vol. 29 ›› Issue (26) : 57-60. DOI: 10.3981/j.issn.1000-7857.2011.26.008
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Impact of Transient Current and Ground Potential Rising on PC in Lightning Risk Assessment

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2011, 29(26): 57-60 https://doi.org/10.3981/j.issn.1000-7857.2011.26.008

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