
Research progress on reliability of 4H-SiC power Schottky diodes
ZHANG Yuming, YUAN Hao, TANG Xiaoyan, SONG Qingwen, HE Yanjing, LI Dongxun, BAI Zhiqiang
Science & Technology Review ›› 2021, Vol. 39 ›› Issue (14) : 63-68.
Research progress on reliability of 4H-SiC power Schottky diodes
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