Collect | Home Page 
   
Science & Technology Review  2019, Vol. 37 Issue (14): 26-33    DOI: 10.3981/j.issn.1000-7857.2019.14.004
Exclusive: Trends in World Science and Technology Current Issue | Archive | Adv Search |
Construction of patent risk assessment indicator system and an international comparison of key indicators
CHENG Yanlin1, LIU Zhipeng2, DAI Tao1
1. Institute of Science and Development, Chinese Academy of Sciences, Beijing 100190, China;
2. School of Public Policy and Management, University of Chinese Academy of Sciences, Beijing 100049, China

Copyright © Editorial office of Science & Technology Review
Tel: +86-10-62138113 Fax: +86-10-62138113 E-mail: jdbbjb@cast.org.cn
京ICP备14028469号-1