Construction of patent risk assessment indicator system and an international comparison of key indicators

CHENG Yanlin; LIU Zhipeng; DAI Tao

doi:10.3981/j.issn.1000-7857.2019.14.004

CHENG Yanlin, LIU Zhipeng, DAI Tao

Science & Technology Review ›› 2019, Vol. 37 ›› Issue (14) : 26-33.

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Science & Technology Review ›› 2019, Vol. 37 ›› Issue (14) : 26-33. DOI: 10.3981/j.issn.1000-7857.2019.14.004

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Construction of patent risk assessment indicator system and an international comparison of key indicators

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2019, 37(14): 26-33 https://doi.org/10.3981/j.issn.1000-7857.2019.14.004

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