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Science & Technology Review  2019, Vol. 37 Issue (14): 26-33    DOI: 10.3981/j.issn.1000-7857.2019.14.004
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Construction of patent risk assessment indicator system and an international comparison of key indicators
CHENG Yanlin1, LIU Zhipeng2, DAI Tao1
1. Institute of Science and Development, Chinese Academy of Sciences, Beijing 100190, China;
2. School of Public Policy and Management, University of Chinese Academy of Sciences, Beijing 100049, China

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