Research progress on reliability of 4H-SiC power Schottky diodes
ZHANG Yuming, YUAN Hao, TANG Xiaoyan, SONG Qingwen, HE Yanjing, LI Dongxun, BAI Zhiqiang
Science & Technology Review . 2021, (14): 63 -68 .  DOI: 10.3981/j.issn.1000-7857.2021.14.006

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